Olympus NDT

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 23183
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS396
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3156
 
 
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 3108
 
 
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 258
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2154
 
 
 
G01H MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES 120
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 1134

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9453823 Apparatus for and a method of improved timing control for non-destructive testing and inspectionAug 01, 14Sep 27, 16[H03K, H01L, G01N]
9279785 Monitoring temperature variation in wedge of phased-array probe for weld inspectionMay 31, 13Mar 08, 16[G01N]
9279786 Method of and an apparatus conducting calibration for phased-array shear wave channels inspecting square barsAug 22, 12Mar 08, 16[G01N]
9244027 Method and instrument for identifying jewelry with plated element using x-ray florescenceMay 31, 13Jan 26, 16[G01N]
9182212 Hall effect probe with exchangeable wear tipsNov 07, 12Nov 10, 15[H01L, G01B]
9032802 Phased array system and method for inspecting helical submerged arcs weld (HSAW)Jan 25, 13May 19, 15[G01N]
8904872 Detection of channel saturation in phase-array ultrasonic non-destructive testingDec 29, 10Dec 09, 14[G10K, G01N]
8698778 Method of manipulating impedance plane with a multi-point touch on touch screenJul 30, 12Apr 15, 14[G06F]
8577629 Method and system for transducer element fault detection for phased array ultrasonic instrumentsMar 25, 09Nov 05, 13[G01N]
8521457 User designated measurement display system and method for NDT/NDI with high rate input dataOct 20, 08Aug 27, 13[G01N, G01R]

View all patents..

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0283,611 SYSTEM AND A METHOD OF ADAPTIVE FOCUSING IN A PHASED ARRAY ULTRASONIC SYSTEMAbandonedMar 25, 13Sep 25, 14[G01B]
8033172 Hand-held flaw detector imaging apparatusExpiredJul 21, 08Oct 11, 11[G01N]
8001841 Ultrasonic fault detection system using a high dynamic range analog to digital conversion systemExpiredJul 20, 06Aug 23, 11[G01N]
2009/0091,318 PHASED SCAN EDDY CURRENT ARRAY PROBE AND A PHASED SCANNING METHOD WHICH PROVIDE COMPLETE AND CONTINUOUS COVERAGE OF A TEST SURFACE WITHOUT MECHANICAL SCANNINGAbandonedSep 09, 08Apr 09, 09[G01N]
2008/0300,748 GPS ENABLED DATALOGGING SYSTEM FOR A NON-DESTRUCTIVE INSPECTION INSTRUMENTAbandonedJun 04, 07Dec 04, 08[G01C, G11C]
2006/0254,359 Hand-held flaw detector imaging apparatusAbandonedJan 17, 06Nov 16, 06[G01N]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.